TOPAZ® Workflow
- Prep.
Prep the chip in the TOPAZ IFC controller to close the interface valves, preventing premature mixing of samples and reagents.
Transfer.
Transfer the samples and reagents into the appropriate wells on the frame of the chip using manual or robotic pipetting techniques.
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Load.
Load the samples and reagents into the chip by placing it in the TOPAZ IFC controller and using the integrated touchscreen interface.
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Image.
Image the chips automatically in the AutoInspeX II workstation according to the recommended schedule.
- Analyze.
Analyze the results using Crystal Vision™ and the Topaz Database, which provide the most accurate crystal scoring in the industry and the ability to investigate results across experiments.
In Situ Diffraction
The 1.96 Diffraction Capable (DC) Chips advanced design makes it possible to obtain high quality in situ X-ray diffraction data during the crystal screening process. Researchers can immediately expose their targets to an x-ray source directly through the chip, thus allowing for hands-off diffraction-based screening. This unique capability enables critical decisions to be based on diffraction data, rather than subjective assessments, such as crystal size, shape, or color.